3.2 - Infrared reflectance measurements of thin films with time variable surface roughness or texture
- AMA Conferences 2013
2013-05-14 - 2013-05-16
- Proceedings OPTO 2013
- O3 - Novel Measuring Technologies
- C. Hoof, D. Wetzlar, B. Henning - University of Paderborn (Germany)
- 58 - 62
For contactless moisture measurement the infrared reflectance measurement is often used. This noninvasive and fast measurement method is suitable for determining the moisture content of bulk materials or coatings and can be used for example to characterize drying processes of paints. The measured infrared radiation is dependent on absorption and scattering in the layer. Moreover, the temporal and local surface dullness (e. g. roughness) or texture influences the measurement results depending on diffuse and direct reflection. In this study an experimental setup which detects both the direct and the diffuse reflected radiation parts is realized. The setup consists of a FTIR- (Fourier Transform Infrared) spectrometer which is extended for a simultaneous determination of spectrograms at different incidence angles (0° as well as 45°).