Available documents

Event Title Author(s)
SENSOR+TEST Conferences 2009 OP5 - A 3D-Fourier-Descriptor Approach to Compress and Classify 3D Imaging Data R. Schmitt, P. Fritz - RWTH Aachen University, Aachen, Germany
SENSOR+TEST Conferences 2009 OP6 - Quality Assurance of Grain with Colour Line Scan Cameras P. Brueckner, K. Anding, H. Weissensee, M. Dambon - Technische Universität Ilmenau, Ilmenau, Germany
SENSOR+TEST Conferences 2009 OP7 - The Design of Calibration Equipment for Dynamic Loading of Optoelectronic Six-Component Force-Torque Sensor M. Kvasnica - University Zlin, Zlin, Czech Republic
SENSOR+TEST Conferences 2009 OP8 - Determination of Patulin Toxicity and its Control in Environment by Optical Biosensor Systems N. Starodub - National University of Life and Environmental Science of Ukraine, Kiev, Ukraine, A. Katsev - Crimean State Medical University, Odessa, Ukraine, L. Pylipenko, I. Pylipenko - National Academy of Foods Technology, Odessa, Ukraine, A. Nabok - Sheffield Halam University, Sheffiled, Great Britain
SENSOR+TEST Conferences 2009 OP9 - An integrated optical scheme for interrogation of interferometric fiber optic sensors A. Kozlov, I. Ilichev, A. Shamray - Ioffe Physico-Technical Institute, St. Petersburg, Russia
SENSOR+TEST Conferences 2009 OP10 - Interference Measurement of Rough Surface Relief O. Angelsky, O. Maksimyak, P. Maksimyak - Chemivtsy University, Chemivtsy, Ukraine
SENSOR+TEST Conferences 2009 OP11 - About the Peculiarities of Using the Optical Bistability Phenomenon in Measuring Systems C. Zenkova - Chemivtsy University, Chemivtsy, Ukraine
SENSOR+TEST Conferences 2009 OP12 - About the Peculiarities of the Polarization Approach to the Measuring of Coherence Properties of Optical Field C. Zenkova, O. Angelsky, N. Gorodyns'ka - Chemivtsy University, Chemivtsy, Ukraine
SENSOR+TEST Conferences 2009 OP13 - 3D-Terahertz-Tomography for Material Inspection and Security T. Loeffler - SynView GmbH, Glashütten, Germany
SENSOR+TEST Conferences 2009 I1.1 - High performance PZT based pyro-detectors with D* of 2x10E9 cmHzE½/W for presence, gas and spectroscopy applications C. Giebeler, J. Wright, S. Freeborn, N. Conway, T. Chamberlain, P. Clark - PYREOS Ltd, Edinburgh, Great Britain, M. Schreiter, D. Pitzer - Siemens AG, Munich, Germany, R. Koehler - DIAS Infrared GmbH, Dresden, Germany