| iCCC2024 - iCampµs Cottbus Conference |
P26 - Total-Ionizing-Dose Radiation Hardness of PJFETs integrated in a 130 nm SiGe BiCMOS Technology |
F. Korndörfer, J. Schmidt, R. Sorge - IHP Leibniz-Institut für innovative Mikroelektronik, Frankfurt/Oder |
| iCCC2024 - iCampµs Cottbus Conference |
P27 - Total-Ionizing-Dose Radiation Hardness of Inter-Layer Dielectrics in a 130 nm SiGe BiCMOS Technology |
F. Korndörfer, J. Schmidt, R. Sorge - IHP Leibniz-Institut für innovative Mikroelektronik, Frankfurt/Oder |
| iCCC2024 - iCampµs Cottbus Conference |
P28 - Self-Consistent Determination of Interface and Bulk Parameters of Oxide/Si/SiGe/Si Layer Stacks by Means of Simultaneous Measurement of Gate Current and High Frequency Gate Capacitance in Non-Steady State Non-Equilibrium |
R. Sorge, W. Wen, M. Lisker, Y. Yamamoto - IHP - Leibniz-Institut für innovative Mikroelektronik, Frankfurt/Oder , N. Inomata - Tohoku University, Sendai (Japan) |
| iCCC2024 - iCampµs Cottbus Conference |
P29 - Characterization of Organic Semiconductors and Conductors by Means of Conductivity and Field Effect Using the Example of Graphene |
T. Stoppe, A. Graf, T. Ludewig, O. Hild - Fraunhofer IPMS, Dresden |
| iCCC2024 - iCampµs Cottbus Conference |
P30 - High Frequency Properties of an Integrated PJFET for Sensor Applications |
C. Wipf, R. Sorge - IHP – Leibniz-Institut für innovative Mikroelektronik, Frankfurt/Oder |
| iCCC2024 - iCampµs Cottbus Conference |
P31 - Optimization of Harmonic Distortions for Electrostatic MEMS Push-Pull NED-Microspeakers |
F. Wall, H. Schenk - Fraunhofer IPMS, Dresden , H. Schenk, A. Melnikov, L. Ehrig, B. Kaiser - Bosch Sensortec GmbH, Dresden |
