P4.3 - Measuring apparatus for determinate absorption of the thin-film coatings by the photothermal method
- Event
- SENSOR+TEST Conferences 2009
2009-05-26 - 2009-05-28
Congress Center Nürnberg - Band
- Proceedings SENSOR 2009, Volume II
- Chapter
- P4 - Optical Sensors
- Author(s)
- G. Petrovska, I. Demkovych, Y. Bobitski - Lviv Polytechnic National University, Lviv, Ukraine
- Pages
- 367 - 370
- DOI
- 10.5162/sensor09/v2/p4.3
- ISBN
- 978-3-9810993-5-5
- Price
- free
Abstract
The optical elements of high-power lasers and lasers systems must have the limiting low absorption so as heat that appears at the absorption produces the thermal deformations of the surfaces of the optical elements; change the spatial, energy and spectral parameters of emission and destruction of the optics.
The problems that are connected with production of the high-quality laser optics expect to the creation of the highly sensitive nondestructive testing methods of absorption in the optical elements, to low the absorption of the thin-film coatings.
In this paper the results development of noncontact nondestructive method for measuring low absorption in thin-film coatings are presented. This method is based on using photothermal effects.