Available documents

Event Title Author(s)
SENSOR+TEST Conferences 2009 C5.2 - EtherCAT - The new standard for measurement applications - Central backbone for distributed systems J. Kessel - ADDITIVE Soft- und Hardware für Technik und Wissenschaft GmbH, Friedrichsdorf, Germany
SENSOR+TEST Conferences 2009 C5.3 - Smart Passive Sensors with RFID Read-Out for Item Tagging M. Hoffmann, M. Schneider - Technische Universität Ilmenau, Ilmenau, Germany, G. Menges - NXP Semiconductors Germany GmbH, Hamburg, Germany, M. Werner - Alcan Packaging Singen GmbH, Singen, Germany
SENSOR+TEST Conferences 2009 C5.4 - WiseNET: an ultra low-power concept for Wireless Sensor Networks J. Decotignie, C. Enz, V. Peiris, M. Huebner - Swiss Center for Electronics and Microtechnology (CSEM), Neuchâtel, Switzerland
SENSOR+TEST Conferences 2009 C6.1 - Topology Optimization of a Piezoelectric Energy Harvester F. Wein, E. Weller, T. Albach, A. Sutor, R. Lerch - Friedrich-Alexander Universität Erlangen-Nürnberg, Erlangen, Germany
SENSOR+TEST Conferences 2009 C6.2 - Energy Scavenging for Monitoring of Overhead Power Line Networks T. Keutel, X. Zhao, O. Kanoun - Chemnitz University of Technology, Chemnitz, Germany
SENSOR+TEST Conferences 2009 C6.3 - Thermo Harvesting – More and Enduring Power for Wireless Systems B. Habbe - Micropelt GmbH, Freiburg, Germany
SENSOR+TEST Conferences 2009 C6.4 - Wireless Sensor Networks: Implementing Reliable, Simple and Secure Industrial Wireless Solutions S. Toteda - Dust Networks, Inc., Hayward, CA, USA
SENSOR+TEST Conferences 2009 P1.1 - A novel measuring system for the metrological characterization of piezoresistive films at high temperature D. Crescini, M. Romani - Università di Brescia, Brescia, Italy
SENSOR+TEST Conferences 2009 P1.2 - Threaded Fluid Condition Sensor for Real-Time, On-Line and In-Line Oil Condition Monitoring J. Andle, K. Durag, M. Chap, R. Haskell - SenGenuity, a Division of Vectron Int’l, Hudson, NH, USA
SENSOR+TEST Conferences 2009 P1.3 - Measuring System for Non-Contact Oscillation Measurement M. Ringe, S. Patzelt, D. Kruse, H. Prekel, G. Goch - Bremen Institute for Metrology, Automation and Quality Science (BIMAQ), Bremen, Germany