1.3 - Design of a sample holder for spectral- and angle-resolved emissivity measurement under vacuum at temperatures up to 1000 °C
- Event
- AMA Conferences 2015
2015-05-19 - 2015-05-21
Nürnberg, Germany - Band
- Proceedings IRS² 2015
- Chapter
- I1 - Calibration and Accuracy
- Author(s)
- M. Reiniger, A. Adibekyan, C. Monte, J. Hollandt - Physikalisch-Technische Bundesanstalt (PTB), Berlin (Germany)
- Pages
- 899 - 902
- DOI
- 10.5162/irs2015/1.3
- ISBN
- 978-3-9813484-8-4
- Price
- free
Abstract
The facility for emissivity measurement under vacuum at the Physikalisch-Technische Bundesanstalt (PTB) is able to measure the directional spectral emissivity in the wavelength range from 4 μm to 100 μm and in the temperature range from -40 °C to 450 °C. Here we present the design of a new sample holder for the extension of the temperature range of this facility up to 1000 °C. We will discuss the concept of heating and the issues of getting a homogeneous temperature distribution on the sample surface. We describe the solutions which are necessary to obtain a homogeneous temperature distribution on the sample surface even at very high temperatures up to 1000 °C.