P1.3 - Characterization of the Linearity of InGaAs Photodetectors Using Series Resistance
- 18. GMA/ITG-Fachtagung Sensoren und Messsysteme 2016
2016-05-10 - 2016-05-11
- P1 Optische Messverfahren
- N. Rahimi, A. Patadia, D. Babic, D. Grubisic - Laser Components Detector Group, Tempe (USA), J. Kunsch - Laser Components GmbH, Olching (Germany)
- 519 - 523
An economical technique has been developed to characterize photodiode linearity. The technique is based on measuring photodiode´s series resistance and is designed for industry applications. The measurement set-up has been made very simple by using only a source-measure unit and plotting software. Presented results clearly show advantages and validity of the proposed technique for characterizing linearity of InGaAs photodiodes using series resistance.