Plenary Talk 2 - NIST on a Chip: Revolutionizing metrology through deployable, quantum-based sensors
- Event
- SMSI 2020
-
(did not take place because of Covid-19 virus pandemic) - Band
- SMSI 2020
- Chapter
- SMSI 2020 - Plenary Talks
- Author(s)
- B. Goldstein - National Institute of Standards and Technology
- Pages
- 30 - 31
- DOI
- 10.5162/SMSI2020/2
- ISBN
- 978-3-9819376-2-6
- Price
- free
Abstract
This talk provides an overview of the NIST on a Chip program, which is transforming how precision measurements are delivered through a suite of fit-for-purpose, quantum-based, traceable sensors. A brief history of the program will be provided, and examples from the program will be used to highlight how the redefinition of the SI, nanofabrication and integrated photonics, and the quantum revolutions have enabled this completely new approach to metrology, which in turn is enabling the fourth industrial revolution. The talk will include a discussion of sensors versus standards, and the importance of public-private partnerships.