M1.3.1 - “Matching” of Photodetectors Integrated in a 0.18 µm Modular CMOS Foundry Technology
- Event
- EUROSENSORS XXXVII
2025-09-07 - 2025-09-10
Wroclaw - Band
- Lectures
- Chapter
- M1.3 - Physical Sensors
- Author(s)
- D. Gaebler, F. Fischer, R. Roesch, P. F. Siles - X-FAB Global Services GmbH, Erfurt (Germany)
- Pages
- 52 - 53
- DOI
- 10.5162/EUROSENSORS2025/M1.3.1
- ISBN
- 978-3-910600-07-2
- Price
- free
Abstract
Matching is a design parameter for analog CMOS applications which describes the statistical device differences between pairs of identical designed and used devices [1]. This is common for transistors but not (yet) for photodiodes. Its significant impact on common optical detection tasks is explained related to extracted values from three photodiodes manufactured in the XS₀₁₈ CMOS technology.
