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M1.3.1 - “Matching” of Photodetectors Integrated in a 0.18 µm Modular CMOS Foundry Technology

Event
EUROSENSORS XXXVII
2025-09-07 - 2025-09-10
Wroclaw
Band
Lectures
Chapter
M1.3 - Physical Sensors
Author(s)
D. Gaebler, F. Fischer, R. Roesch, P. F. Siles - X-FAB Global Services GmbH, Erfurt (Germany)
Pages
52 - 53
DOI
10.5162/EUROSENSORS2025/M1.3.1
ISBN
978-3-910600-07-2
Price
free

Abstract

Matching is a design parameter for analog CMOS applications which describes the statistical device differences between pairs of identical designed and used devices [1]. This is common for transistors but not (yet) for photodiodes. Its significant impact on common optical detection tasks is explained related to extracted values from three photodiodes manufactured in the XS₀₁₈ CMOS technology.

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