| SMSI 2025 |
B4.1 - Small Optical Measurement System for Stable Detection of Mold Growth |
V. Rathnayake, T. Schweizer, S. van den Driesche, M. Vellekoop - University of Bremen, Bremen (Germany) |
| SMSI 2025 |
B4.2 - Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity |
L. Long, X. Xu, M. Schaedel, G. Brokmann, T. Ortlepp - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
| SMSI 2025 |
B4.3 - Fiber Optic Current Sensor System for Long-Term Monitoring of Geomagnetically Induced Currents in the Power Grid |
J. Mandl, P. Trampitsch, A. Fröhlich, R. Klambauer, A. Bergmann - University of Technology, Graz (Austria) |
| SMSI 2025 |
B5.1 - Model-based Reconstruction of Freeform Surfaces with Radial Basis Functions |
F. Fleischmann, D. Hilbig - Hochschule Bremen, Bremen (Germany), T. Binkele - OPTIMARE Systems GmbH, Bremerhaven (Germany), N. Müller - ATLAS ELEKTRONIK GmbH, Bremen (Germany) |
| SMSI 2025 |
B5.2 - OPC UA for IO-Link Wireless in a Cyber Physical Finite Element Sensor Network for Shape Measurement |
H. Beuster, L. Bretthauer, G. Scholl - Helmut Schmidt University, Hamburg (Germany) |
| SMSI 2025 |
B5.3 - OEFPIL: An Alternative Method for Curve Fitting |
A. Campbell, R. Slesinger, M. Sira - Czech Metrology Institute, Okruzni (Czech Republic), V. Witkovsky, G. Wimmer - Slovak Academy of Sciences, Bratislava (Slovakia) |
| SMSI 2025 |
B5.4 - Methods of uncertainty evaluation using virtual experiments with the example of the tilted-wave interferometer |
M. Stavridis, M. Marschall, F. Hughes, I. Fortmeier, C. Elster - Physikalisch-Technische Bundesanstalt Braunschweig and Berlin (Germany) |
| SMSI 2025 |
B6.1 - Fast Tracking using Event-based Vision Sensors and Binary Frames |
J. Baßler, M. Heizmann - Karlsruhe Institute of Technology, Karlsruhe (Germany) |
| SMSI 2025 |
B6.2 - Performance Comparison of Area-scan and Event-based Image Sensors |
A. Manakov, B. Jähne - Heidelberg University, Heidelberg (Germany) |
| SMSI 2025 |
B6.3 - Motion Compensation of Event-Streams for Multitarget Tracking in Sensor-Based Sorting |
P. Bäcker, G. Maier - Fraunhofer IOSB, Karlsruhe (Germany) |