B5.3 - OEFPIL: An Alternative Method for Curve Fitting
- Event
- SMSI 2025
2025-05-06 - 2025-05-08
Nürnberg - Band
- Lectures
- Chapter
- B5 - Modeling
- Author(s)
- A. Campbell, R. Slesinger, M. Sira - Czech Metrology Institute, Okruzni (Czech Republic), V. Witkovsky, G. Wimmer - Slovak Academy of Sciences, Bratislava (Slovakia)
- Pages
- 107 - 108
- DOI
- 10.5162/SMSI2025/B5.3
- ISBN
- 978-3-910600-06-5
- Price
- free
Abstract
In recent years, as measurement processes have grown increasingly complex, curve fitting has become a vital tool for aligning theoretical models with observed data. As instrumentation improves, previously overlooked uncertainties must now be addressed for more precise measurements. Uncertainties as well as correlation in both dependent and independent variables should be taken into account. This is illustrated by applying the algorithm OEFPIL to the determination of the internal resistance of an AC source from its loading characteristics.