E2.1 Introduction “Future Topics in Metrology”
- SMSI 2020
(did not take place because of Covid-19 virus pandemic)
- SMSI 2020 - System of Units and Metrological Infrastructure
- E2 Future Topics in Metrology
- S. Eichstädt - Physikalisch-Technische Bundesanstalt, Berlin (Germany)
- 362 - 363
Technological developments in industry and society result almost directly in novel requirements for metrology. This special session highlights a few of such future topics, presented by young scientists. The session focuses on novel developments and topics arising from the digital transformation in industry and society. This contains NMI-level calibration for and application of MEMS sensors; semantic data management and ontologies in sensor networks; deep learning for inverse problems in form metrology; uncertainty evaluation in machine learning.