E2.1 Introduction “Future Topics in Metrology”
- Event
- SMSI 2020
-
(did not take place because of Covid-19 virus pandemic) - Band
- SMSI 2020 - System of Units and Metrological Infrastructure
- Chapter
- E2 Future Topics in Metrology
- Author(s)
- S. Eichstädt - Physikalisch-Technische Bundesanstalt, Berlin (Germany)
- Pages
- 362 - 363
- DOI
- 10.5162/SMSI2020/E2.1
- ISBN
- 978-3-9819376-2-6
- Price
- free
Abstract
Technological developments in industry and society result almost directly in novel requirements for metrology. This special session highlights a few of such future topics, presented by young scientists. The session focuses on novel developments and topics arising from the digital transformation in industry and society. This contains NMI-level calibration for and application of MEMS sensors; semantic data management and ontologies in sensor networks; deep learning for inverse problems in form metrology; uncertainty evaluation in machine learning.