C7.3 Quantitative Evaluation of Artefact Reduction by an Optimized Specimen Orientation for Metrology Based on Industrial Computed Tomography
- SMSI 2021
2021-05-03 - 2021-05-06
- SMSI 2021 - System of Units and Metreological Infrastructure
- C7 Testing and Inspection
- M. Kaufmann, I. Effenberger - Fraunhofer Institute IPA, Stuttgart (Germany)
- 296 - 297
Industrial Computed Tomography is used to solve metrological tasks in quality assurance. Although CT has many advantages like complete and non-destructive data acquisition, artefacts can occur depending on the part’s material and geometry. Moreover the extent of scanning artefacts strongly depends on the specimen’s orientation. By a raycasting approach, the homogeneity of penetration lengths is determined and maximized in order to find the optimal orientation. The reduction of artefacts is assessed by point-based quality metrics. The results show a local contrast improvement of 80 %.