4.3.4 - Electrokinetic Self-Cleaning of Mixed-Phase Contaminants on Optical Sensors in Physical AI
- Event
- EUROSENSORS 2026
2026-09-06 - 2026-09-09
Zurich - Band
- Lectures
- Chapter
- Emerging Sensor Materials
- Author(s)
- D. J. Lee, T. H. Jang, Y. Kim, S. K. Chung - Myongji University,Yongin (South Korea), J. Lee - Microsystems Inc.,Yongin (South Korea)
- Pages
- 148 - 149
- DOI
- 10.5162/eurosensors2026/4.3.4
- ISBN
- 978-3-910600-12-6
- Price
- free
Abstract
This paper presents an active electrokinetic cleaning device that integrates dielectrophoresis (DEP) and electrowetting-on-dielectric (EWOD) to simultaneously remove solid and liquid contaminants from optical sensors in Physical AI systems. By applying alternating current voltage to a transparent electrode, both particles and droplets are removed without mechanical moving parts. The restoration of object recognition accuracy in a contaminated optical sensor verifies the applicability of this approach.