SMSI 2025 |
P16 - Optical signal transmission solutions for electromobility and renewable energies in favor of a low carbon future |
A. Schäfer - Hottinger Brüel and Kjaer GmbH (HBK), Darmstadt (Germany) |
SMSI 2025 |
P17 - Influence of Length on the Electromigration of Aluminum through Molybdenum disilicide Thin films |
J. Baldauf, A. Winzer, T. Ortlepp - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
SMSI 2025 |
P18 - Changes in Amorphous Molybdenum Disilicide Thin Films Caused by Electrical Current Stressing |
J. Baldauf, S. Reiß, A. Winzer, T. Ortlepp - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
SMSI 2025 |
P19 - Benchmarking Robot and Cobot Performance for an Assembly Application |
M. Gapp, A. Fischer-Janzen, D. Pfister, T. Wendt - University Offenburg, Offenburg (Germany), S. Rupitsch - University Freiburg – IMTEK, Freiburg (Germany) |
SMSI 2025 |
P20 - Practical Realization of Johnson’s Noise Thermometer |
J. Martinek, V. Hortvík, P. Klapetek - Czech Metrology Institute, Brno (Czech Republic) |
SMSI 2025 |
P21 - Elastically stable tensile force sensors for belt tension monitoring |
T. Frank, A. Cyriax, S. Hermann, A. Grün - CiS Forschungsinstitut für Mikrosensorik, Erfurt (Germany) |
SMSI 2025 |
P22 - Optimized hardness testing: Precise force application and measurement at low forces |
T. Frank, S. Hermann, A. Grün, H. Wünscher - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany), P. Beisel - KB Prüftechnik GmbH, Hochdorf-Assenheim (Germany) |
SMSI 2025 |
P23 - Signal evaluation of force sensors based on silicon strain gauges using artificial neural networks |
T. Frank, S. Hermann - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
SMSI 2025 |
P24 - Add-on kit for non-invasive pressure measurement on process pipes |
T. Frank, A. Cyriax, A. Grün, S. Hermann, M. Kermann, S. Jagomast, A. Grün - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
SMSI 2025 |
P25 - Membrane Characterization of Transparent Photodiodes |
C. Möller, D. Mitrenga, T. Klein, A. Winzer, T. Ortlepp - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |