Available documents

Event Title Author(s)
SMSI 2020 D2.1 Artificial Intelligence with Neural Networks in Optical Measurement and Inspection Systems – Opportunities and Challenges M. Heizmann, M. Ulrich - Karlsruhe Institute of Technology, Karlsruhe (Germany), A. Braun - University of Applied Sciences, Düsseldorf (Germany), M. Hüttel - Fraunhofer IPA, Stuttgart (Germany), C. Klüver - University of Duisburg-Essen, Essen (Germany), E. Marquardt - VDI e. V., Düsseldorf (Germany, M. Overdick - SICK AG, Waldkirch (Germany)
SMSI 2020 D2.2 Visualizing Neural Network Decisions for Industrial Sound Analysis S. Grollmisch - University of Technology, Ilmenau (Germany), D. Johnson, J. Liebetrau - Fraunhofer Institute IDMT, Ilmenau (Germany)
SMSI 2020 D2.3 Adaptive algorithms for linear position measurement applications A. Voss, A. Bartos - TE Connectivity Sensors Germany GmbH, Dortmund (Germany)
SMSI 2020 D2.4 Lean data with edge analytics: Decentralized current profile analysis on embedded systems using neural networks T. Küfner - University Bayreuth, Bayreuth (Germany), A. Trenz - Fraunhofer IPA, Bayreuth (Germany), S. Schönig - Maxsyma GmbH & Co. KG, Floss (Germany)
SMSI 2020 D2.5 Application of Machine Learning Algorithms for the Analysis of an Optical Fiber Sensor for Use in Endovascular Coiling of Intracranial Aneurysms S. Shojaei Khatouni, J. Ewald, H. Trieu - Hamburg University of Technology, Hamburg (Germany)