| SMSI 2023 |
D4.3 - 3D Bin Picking with an innovative powder filled gripper and a torque controlled collaborative robot |
T. Wendt, F. Kirner, N. Hangst - Hochschule Offenburg, Offenburg (Germany) |
| SMSI 2023 |
D4.4 - Innovative and cost-effective Measurement Setup to determine Robot Accuracy |
M. Gapp, A. Fischer, T. Wendt - University of Offenburg, Offenburg (Germany) |
| SMSI 2023 |
D5.0 - Compressed Sensing Spectral Photoluminescence Imaging of Wide Bandgap Semiconductor Materials for Power Electronics Applications |
S. Wood, J. Blakesley, G. Koutsourakis, A. Thompson - National Physical Laboratory, Teddington (United Kingdom) |
| SMSI 2023 |
D5.1 - Compressed nano-FTIR Hyperspectral Imaging for Characterizing Defects in Semiconductors |
B. Kästner, C. Elster, A. Hoehl, M. Marschall, D. Siebenkotten, G. Wübbeler - Physikalisch-Technische Bundesanstalt, Berlin (Germany), E. Rühl - Freie Universität Berlin, Berlin (Germany), S. Wood - National Physical Laboratory, Teddington (United Kingdom) |
| SMSI 2023 |
D5.2 - Optical and Tactile Measurements on SiC Sample Defects |
J. Grundmann, B. Bodemann - Physikalisch-Technische Bundesanstalt, Braunschweig (Germany), E. Ermilova, A. Hertwig - Bundesanstalt für Materialforschung und -prüfung, Berlin (Germany), P. Klapetek - Cesky Meteorologicky Institut (CMI), Brno (Czechia), S. Pereira, J. Rafighdoost - Delft University of Technology, Delft (Netherlands) |
| SMSI 2023 |
D5.3 - Electrical Characterization of the SiO2/4H-SiC Interface |
C. Nanjappan, G. Pfusterschmied, U. Schmid - Technische Universität Wien, Vienna (Austria) |
| SMSI 2023 |
D5.4 - Compressed Sensing Time Resolved Photoluminescence Imaging for Semiconductor Characterisation |
A. Baltusis, G. Koutsourakis, S. Wood, S. Sweeney - University of Surrey, Guildford (United Kingdom) |
| SMSI 2023 |
D6.1 - Multiplexing interferometers to provide novel capabilities for nanometrology |
T. Kissinger - Technische Universität Ilmenau, Ilmenau (Germany) |
| SMSI 2023 |
D6.2 - Measuring sub nanoradian angles |
A. Yacoot - National Physical Laboratory, Teddington (United Kingdom), S. Alcock, R. Ince, H. Patel - Diamond Light Source, Didcot (United Kingdom) |
| SMSI 2023 |
D6.3 - Recent progress on AFM te chniques for traceable 3D nanometrology at PTB |
G. Dai, J. Thiesler, J. Degenhardt - Physikalisch-Technische Bundesanstalt, Braunschweig (Germany), R. Tutsch - Technical University of Braunschweig, Braunschweig (Germany) |