C4.3 Emissivity Measurement of Semitransparent Samples
- Event
- SMSI 2020
-
(did not take place because of Covid-19 virus pandemic) - Band
- SMSI 2020 - Sensors and Instrumentation
- Chapter
- C4 IRS² Satellite Conference: Infrared Sensor Applications: Non-destructive Testing, Spectroscopy
- Author(s)
- J. Gieseler, A. Adibekyan, C. Monte, J. Hollandt - Physikalisch-Technische Bundesanstalt (PTB), Braunschweig (Germany)
- Pages
- 173 - 174
- DOI
- 10.5162/SMSI2020/C4.3
- ISBN
- 978-3-9819376-2-6
- Price
- free
Abstract
The characterization of infrared optical properties of semitransparent samples between 6 μm and 25 μm and between 20 °C and 90 °C is hampered by the fact, that the apparent emittance, reflectance and transmittance are intertwined in the optical signals. We report on an approach for the simultane-ous measurement of transmittance and reflectance of semitransparent samples, expanding PTB’s established emissivity measurement facilities under air and under vacuum. Measurements of silicon were performed under air, evaluated, and, additionally, validated by independent measurements.