A3.3 Active Display Registration in Phase Measuring Deflectometry
- Event
- SMSI 2023
2023-05-08 - 2023-05-11
Nürnberg - Band
- Lectures
- Chapter
- A3 - Metrology in the digital age
- Author(s)
- Y. Sperling, R. Bergmann - Bremer Institut für angewandte Strahltechnik, Bremen (Germany)
- Pages
- 49 - 50
- DOI
- 10.5162/SMSI2023/A3.3
- ISBN
- 978-3-9819376-8-8
- Price
- free
Abstract
Phase measuring deflectometry (PMD) is a robust and low cost full-field shape measure-ment method for specular surfaces. It is based on the reflection of light rays. A display is showing sinusoidal fringe patterns which are reflected by a surface under test (SUT) and recorded with a camera. Using phase shifting technique, this establishes a correspondence between camera pixels and phase angles of the sine patterns, encoding positions on the display. This phase information is used to determine the shape of the SUT by means of inverse ray tracing.