| SMSI 2023 |
C1.1 - One-Step Traceability with NIST on a Chip: A Case for the Emergence of Quantum-Based Methods for Metrology and Sensing of Pressure, Vacuum, Temperature, Electric Fields, Mass, Force, and Torque, all enabled by the New SI |
J. Hendricks, B. Goldstein, A. Artusio-Glimpse, C. Holloway, M. Simons, N. Prajapati, A. Rotunno, S. Berweger, N. Klimov, Z. Ahmed, D. Barker, S. Eckel, J. Fedchak, J. Ricker, K. Douglass, T. Herman, M. Chojnacky, J. Scherschligt, S. Schlamminger, L. Chao, Z. Comden, J. Draganov, T. Bui - National Institute of Standards and Technology, Gaithersburg (USA), K. Campbell, M. Jayaseelan - University of Colorado, Boulder (USA) |
| SMSI 2023 |
C1.2 - Rydberg Atoms for One-Step Traceability for Sensing Electric Fields |
A. Artusio-Glimpse, C. Holloway, M. Simons, N. Prajapati, A. Rotunno, S. Berweger - National Institute of Standards and Technology, Boulder (USA), K. Campbell, M. Jayaseelan - University of Colorado, Boulder (USA) |