D2.3 - Modelling in Measurement - From classical analytical approaches to cognitive data-driven solutions -
- Event
- SMSI 2023
2023-05-08 - 2023-05-11
Nürnberg - Band
- Lectures
- Chapter
- D2 - New Developments in Mathematics for Metrology
- Author(s)
- N. Schiering - ZMK & ANALYTIK GmbH, Bitterfeld-Wolfen, (Germany), M. Heizmann - Karlsruhe Institute of Technology, Karlsruhe (Germany), W. Koch - Fraunhofer FKIE, Wachtberg (Germany), K. Sommer - Technische Universität Ilmenau, Ilmenau (Germany)
- Pages
- 209 - 210
- DOI
- 10.5162/SMSI2023/D2.3
- ISBN
- 978-3-9819376-8-8
- Price
- free
Abstract
Models are an inseparable part of Metrology. They make it possible to derive measurement results, including measurement uncertainties, from measurement data or output signals and knowledge about the measurement process. Models establish a functional relationship between the measurand and all relevant quantities on which the measurand depends. Models do not necessarily have to be derived from analytical-functional relationships; they are increasingly data-driven with cognitive capabilities. In general, they are used to design measurement systems, analyze measurement data, make inferences and predictions, and form the basis for evaluating measurement uncertainties.