C1.3 - Integrated Nanophotonics for One One-Step Traceability for Temperature Measurements
- Event
- SMSI 2023
2023-05-08 - 2023-05-11
Nürnberg - Band
- Lectures
- Chapter
- C1 - NIST on a Chip for Sensing Metrology and One-Step Tracebility
- Author(s)
- N. Klimov, K. Douglass, T. Herman, Z. Ahmed, M. Chojnacky - National Institute of Standards and Technology, Gaithersburg (USA)
- Pages
- 145 - 146
- DOI
- 10.5162/SMSI2023/C1.3
- ISBN
- 978-3-9819376-8-8
- Price
- free
Abstract
We report on the development of the next-generation photonics-based thermometry at National Institute of Standards and Technology (NIST). We provide details on design, fabrication, and performance of ultra-high resolution photonic thermometers. Our device shows a noise floor of sub-10 μK when measured at water triple point and gallium fixed-point cells, demonstrating the potential for photonic thermometry that is on-par or even better than the state-of-the-art resistance thermometry.