D3.3 - Accelerated Life Tests for Determining the Expected Lifetime – Test Strategy for IR-MEMS-Emitter
- Event
- SMSI 2025
2025-05-06 - 2025-05-08
Nürnberg - Band
- Lectures
- Chapter
- D3 - IR and Temperature Measurement
- Author(s)
- L. Bindel, F. Huwald, L. Oechler, A. Isserstedt-Trinke, S. Biermann - Micro Hybrid Electronic GmbH, Hermsdorf (Germany)
- Pages
- 200 - 201
- DOI
- 10.5162/SMSI2025/D3.3
- ISBN
- 978-3-910600-06-5
- Price
- free
Abstract
A procedure for estimating expected lifetime of IR-MEMS-emitters was developed. A pre-test to examine the main influencing factor that limits lifetime has been carried out. Membrane temperature of the IR-MEMS-emitters was identified as the main influencing factor for electromigration, reducing lifetime. For this reason, the Arrhenius life stress model, a temperature based physical model, is used for calculating expected lifetime at nominal conditions.