| SMSI 2025 |
B2.3 - Simultaneous Analysis of Local Device Layer Thickness and Film Stress on Cantilevered MEMS Structures |
D. Huber, C. Schallert, G. Pfusterschmied, U. Schmid - TU Wien, Vienna (Austria) |
| SMSI 2025 |
B2.4 - Nanoelectromechanical System Fourier Transform Infrared Spectroscopy (NEMS-FTIR) for Nanoplastic and Polymer Degradation Analysis |
J. Timarac-Popovic, A. Giesriegl, H. Besic, S. Schmid - TU Wien, Vienna (Austria), J. Hiesberger, N. Luhmann, J. Lafleur - Invisible-Light Labs GmbH, Vienna (Austria) |
| SMSI 2025 |
B3.1 - High-Sensitive Chromium Strain Gauges on Steel Surfaces |
R. Ottermann, T. Steppeler, M. Wurz - Leibniz University Hannover, Garbsen (Germany) |
| SMSI 2025 |
B3.2 - Analysis of positioning parameters at glazing of pressure measurement cells |
I. Jenei, R. Wagner, M. Nikolic - ETO SENSORIC GmbH, Nürnberg (Germany), A. Grün - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
| SMSI 2025 |
B3.3 - Advanced Glass Packaging with Integrated Stress Relief Structures for MEMS Pressure Sensors |
M. Bertke, S. Schudak - LPKF Laser & Electronics SE, Garbsen (Germany) |
| SMSI 2025 |
B3.4 - Sensors on PEEK - Advantages of Plastic Substrates in Microsystem and MEMS Technology |
S. Bengsch, E. Fischer, S. Bur - Ensinger GmbH, Nufringen (Germany) |
| SMSI 2025 |
B4.1 - Small Optical Measurement System for Stable Detection of Mold Growth |
V. Rathnayake, T. Schweizer, S. van den Driesche, M. Vellekoop - University of Bremen, Bremen (Germany) |
| SMSI 2025 |
B4.2 - Low-Noise Silicon APD with Enhanced Blue-Violet Sensitivity |
L. Long, X. Xu, M. Schaedel, G. Brokmann, T. Ortlepp - CiS Forschungsinstitut für Mikrosensorik GmbH, Erfurt (Germany) |
| SMSI 2025 |
B4.3 - Fiber Optic Current Sensor System for Long-Term Monitoring of Geomagnetically Induced Currents in the Power Grid |
J. Mandl, P. Trampitsch, A. Fröhlich, R. Klambauer, A. Bergmann - University of Technology, Graz (Austria) |
| SMSI 2025 |
B5.1 - Model-based Reconstruction of Freeform Surfaces with Radial Basis Functions |
F. Fleischmann, D. Hilbig - Hochschule Bremen, Bremen (Germany), T. Binkele - OPTIMARE Systems GmbH, Bremerhaven (Germany), N. Müller - ATLAS ELEKTRONIK GmbH, Bremen (Germany) |
